About Shimadzu

Shimadzu is releasing a new energy dispersive X-ray fluorescence spectrometer designed specifically for RoHS/ELV screening inspections (model name: EDX-LE). The model uses an electronic cooling detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation costs and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability.

* X-ray fluorescence spectrometers are used to ascertain the type and content of elements contained in a sample by analyzing the energy (wavelength) and intensity of fluorescent X-rays generated when the sample is exposed to X-rays. They can analyze solids, powders, and liquids nondestructively and quickly analyze hazardous elements contained in electronic equipment such as printed circuit boards. For this reason they are widely used by manufacturers for quality control purposes to ensure compliance with RoHS/ELV directives.

There are two types of X-ray fluorescence spectrometers: a high-resolution "wavelength dispersive type" that incorporates a spectroscopic method using analyzing crystal, and an "energy dispersive type" that features the direct detection method using a semiconductor detector with no dispersion. This type of instrument can be compact and highly operable. Shimadzu has a 30 % market share in the energy dispersive X-ray fluorescence spectrometer market in Asia including China, which is a major RoHS/ELV-related market.

Features of the New Model

The EDX-LE has the following features required for instruments designed specifically for RoHS/ELV screening (method to determine if the content of a hazardous element contained in a product is over the control standard value).

• Since an electronic cooling Si-PIN semiconductor detector* is used, the instrument does not need liquid nitrogen for cooling. As a result, the instrument's operation cost is lower. In addition, the waiting time to start analysis after turning on the power has been shortened to approximately 15 minutes.
  
  *An electronic cooling detector using silicon. It can directly control the cooling capacity by current.
  
  
• Newly-developed screening software enables the evaluation of materials contained in a sample, selection of optimum analysis conditions, and screening judgment to be performed automatically. Inspection reports can be easily created with just a single click. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive*.
  
  * Five elements: Cadmium (Cd), lead (Pb), mercury (Hg), chromium (Cr), and bromine (Br)

• The large rectangular sample chamber can accommodate various sample shapes and sizes, allowing analysis of a wide variation of samples.
  
• A collimator to select analysis regions for trace samples and a sample observation camera necessary for generating reports are supplied as standard.

Background of the Development of the New Model

In order to perform high-precision analysis using an energy dispersive X-ray fluorescence spectrometer, a high-resolution detector, which requires cooling using liquid nitrogen, is necessary. However, eliminating the use of liquid nitrogen has been strongly demanded for higher workability and lower operation cost due to the high quantity of screening inspections.

The new model was developed specifically for RoHS/ELV screening inspections to satisfy these needs. By releasing the highly functional, easy-to-use EDX-LE for screening, Shimadzu aims to satisfy the need to replace older models in the energy dispersive X-ray fluorescence spectrometer market in Japan. In addition, Shimadzu seeks to increase its market share in the screening equipment market, particularly in China where there is a strong demand for the purchase of new and additional instruments.