World first 250 µm Mapping!
LAB CENTER XRF-1800
With spirit of a pioneer of local analysis, mapping and 4 kW thin-window X-ray tube, Shimadzu brush up these technologies with reviewing hardware and software, and achieve more reliable, more operative and more functional system. We are proud to introduce XRF-1800 system.
Features:
Sample of mapping (rare earth)
World first 250µm Mapping for wavelength dispersive analysis (patented). This enables to analyze content distribution and intensity distribution of non uniform sample.
Sample of analysis
(blue: First-order
X-ray profile,
red: Higher-order
X-ray profile)
Qualitative/quantitative analysis using higher-order X-rays (patent pending). More accurate evaluation of higher-order X-rays makes higher.
Film thickness measurement and inorganic component analysis for high-polymer thin films with background FP method (patented).
Local analysis
CCD camera option for sample position designation (patent pending).
4 kW thin-window X-ray tube for high reliability and long life. Compared with conventional 3 kW tube, more than double of sensitivity is achieve in light elements.
Ease of use – template and matching functions based on Shimadzu expertise. Optimal conditions can be created based on prepared conditions for sample forms like liquid, powder, solid, metal and oxides.
*Appearance and specification may be changed without prior notice.
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