X-ray Diffraction

X-ray diffractometers can non-destructively analyze matter in regular atmospheric conditions. Qualitative analysis of matter, lattice constant determination, stress measurement, and other operations are possible. Quantitative analysis can also be performed from peak area calculations.

Moreover, various other analyses including particle size or crystallinity measurement and precision X-ray structural analysis can be performed from the peak profile or the angular spread of the peak.

Product Lineup

XRD-7000

Shimadzu XRD are designed with the concept ‘Provide solution to XRD analysis by ease of use and versatility’. Basic system with high precision goniometer can be varied with optional items to adapt to the purpose. Please experience versatility based on firm technology.

XRD-6100

High speed and high precision vertical goniometer for various application.

OneSight Wide-Range High-Speed Detector

The OneSight consists of a semiconductor Si sensor array.

Solution System Packages

For Research Use Only. Not for use in diagnostic procedures.

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