X-ray diffractometers can non-destructively analyze matter in regular atmospheric conditions. Qualitative analysis of matter, lattice constant determination, stress measurement, and other operations are possible. Quantitative analysis can also be performed from peak area calculations.
Moreover, various other analyses including particle size or crystallinity measurement and precision X-ray structural analysis can be performed from the peak profile or the angular spread of the peak.
High speed and high precision vertical goniometer for various application.
The OneSight consists of a semiconductor Si sensor array.