MAXima_X XRD-7000
X-ray Diffractometer


Provide solution to XRD analysis by ease of use and versatility

MAXima_X XRD-7000

Shimadzu XRD are designed with the concept ‘Provide solution to XRD analysis by ease of use and versatility’. Basic system with high precision goniometer can be varied with optional items to adapt to the purpose. Please experience versatility based on firm technology.

Features:

MAXima_X XRD-7000

MAXima_X XRD-7000

  • High precision vertical θ-θ goniometer that can accept up to 400mm (w) x 5500mm (d) x 400mm (h) maximum.
  • Various application of residual austenite quantitation, environmental quantitative analysis, precise lattice constant determination, degree of crystallinity calculations, crystallite size and crystal strain calculations, crystal system determination, rietveld analysis, other software based crystal structure analysis as well as basic qualitative analysis and quantitative analysis.

    • Sample of stress mapping image

    Sample of stress mapping image

  • Large R-θ stage can accept sample up to 350 mm diameter and 190 mm thickness. Automatic stress mapping is possible.
  • Polycapillary optical system that makes high intension parallel X-ray beam (option)


    • Application using the polycapillary parallel beam optical system
    Foods, Pharmaceuticals, Organism
    Mechanical Components

    *Appearance and specification may be changed without prior notice.

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