Structural analysis of isomeric chemicals by using high resolution MS/MS on Curved Field Reflectron incorporated with a novel focusing technology

While resolution of MS has been greatly improved recently, no matter how high resolution of MS is achieved, MS/MS is essential to conduct analysis of isomeric chemicals, and the analysis is thought to be still significant task given to mass spectrometry. To date, we applied PSD and high energy CID in curved field reflectron to the analysis, since intensities of fragment ions in the reflectron were susceptible to isomeric forms. Recently, we incorporated a new focusing technology into the curved field reflectron, which enabled to obtain 10,000 resolution of MS/MS. We will apply the new curved field reflectron toward ambiguous assignment and differentiation of isomeric chemicals.