inspeXio SMX-225CT
Microfocus X-ray CT System

The inspeXio SMX-225CT is Shimadzu's top-of-the-line microfocus X-ray CT system, which features a high precision CT stage and sophisticated image processing software, inspeXio, that allows "anyone" to obtain "Clear" CT images "easily". With previous systems, some customers thought the procedures were difficult to learn, there were too many functions to be covered, and there were so many parameter settings they didn't know which parameters should be adjusted. However, with the inspeXio SMX-225CT, all these frustrating settings can be performed automatically by inspeXio, the sophisticated image processing software. This makes it possible for users to obtained "Clear" CT images "easily".
The system also includes many features made possible only by Shimadzu's extensive experience developing X-ray CT systems, such as using an exterior camera to offer calibration-free intuitive positioning, X-ray parameter settings automatically tailored to samples, and a 3D real-time scan position display feature that displays the current scan region in a 3D display area.
This system is ideal for non-destructive testing and analysis of automotive, electronic, and other such parts.

Samples can be CT-scanned without the need for calibration. Just set the sample in place and press the start button.

The CT scan auto-positioning function uses Shimadzu's proprietary intuitive positioning system, based on using an exterior camera, and which was well received in the SMX-1000 series. This feature allows determining the CT scan position and CT scan region semi-automatically by interactively deciding respective CT scan parameters one by one via a wizard type interface shown below.

The optimum X-ray parameters for each sample type can be set automatically.

A CT scan region display has been added. Since the target region inside the sample is displayed in real time, this allows almost anybody to easily perform high-resolution CT scans. With this function, data from previous CT scans can be used to identify areas of interest for scanning at higher magnifications.