Surface Analysis

Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers.
EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.

Product Information

 

Product Lineup

SPM-8100FM High Resolution Scanning Probe Microscope

The HR-SPM is a new scanning probe microscope that uses frequency detection. This achieves the same ...

SPM-9700HT Scanning Probe Microscope

“Scanning probe microscope” (SPM) is the general term used to describe a microscope that allows the ...

EPMA-8050G Electron Probe Microanalyzer

This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecede...

EPMA-1720 Electron Probe Microanalyzer

Both hardware and software incorporate the latest technologies to create the next generation of EPMA...

Product Lineup

X-Ray Photoelectron Spectrometers

Visit Kratos Analytical web site for information on our XPS instruments.

Solution System Packages

For Research Use Only. Not for use in diagnostic procedures.

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