Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers.
EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
The HR-SPM is a new scanning probe microscope that uses frequency detection. This achieves the same ...
“Scanning probe microscope” (SPM) is the general term used to describe a microscope that allows the ...