SPM-8100FM - Specs

High-Resolution Scanning Probe Microscope

Observation mode

Contact, dynamic (AM method and FM method), lateral force (LFM)

Resolution

Horizontal: 0.2 nm; Vertical: 0.01 nm

SPM head

Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates a cantilever continuously even while replacing samples Detector: Photodetector

{"title":"Specification Sheet Downloads","description":"Download the latest specification sheets.","source":"product","key":3503,"max":"30","filter_types":["spec_sheet"],"link_title":"View other Downloads","link_url":""} {"title":"Downloads","description":"Download the latest brochure.","source":"product","key":3503,"max":"30","filter_types":["brochures"],"link_title":"View other Downloads","link_url":"","pdf_links":[]}