Scanning Probe Microscope
Temperature and Humidity Controller
FC Film Observation with Environmentally Controlled Temperature and Humidity
Variations in the surface shape of Nafion film due to changes in humidity were observed. In each case, microscopic features of about a few nm in height were observed, but the images show that increasing the humidity results in smoother features and more swelling.
Variations in the shape of polymer film were observed using a controlled temperature and humidity environment.
Gas Spray Unit
The gas spray unit is attached to a spare port to spray small amounts of gas on the sample.
Real Time Observation of Nickel Surface Variations
The nickel surface's reaction to gas was observed continuously in real time. When the clean surface after reduction (left) started being sprayed with carbon monoxide, the change in shape was observed as carbonyl complexes were formed (right). (Data provided by former National Institute of Materials and Chemical Research)
Sample Heating and Cooling Unit
The sample can be loaded into the unit and heated or cooled.
Observation of Cooled Plastic
Two separate phases were observed in the viscosity image
Sample Heating Unit
The sample can be loaded into the unit and heated. The unit can even be operated in atmospheric conditions, depending on the sample.
Observation of Heated Polymer Film
Light Irradiation Unit
This unit enables using a fiber optic light to irradiate sample surfaces. It does not include the light source or the optical fiber. It can be operated in atmospheric conditions.
Observation of Ultraviolet Light Irradiating Pentacene Thin Film on SrTiO3
The pentacene thin film was formed as a cluster of two or three 1.6 nm thick layers. When irradiated with 365 nm wavelength ultraviolet light, the cluster structure gradually started breaking apart. After 40 minutes, the thin film cluster was mostly gone. During this time, there is negligible drift and observation is possible using the same field of view. (Data provided by Dr. Yuji Matsumoto, Frontier Research Center, Tokyo Institute of Technology).