Scanning Probe Microscope

Functionality and Expandability to Meet a Wide Range of Requirements

Functionality and Expandability to Meet a Wide Range of Requirements

With a generous selection of measurement modes, images can be obtained that show other information besides the sample shape, such as electrical current or electrical potential levels, or surface hardness or viscosity properties.

Contact Mode AFM

This mode scans the sample surface by using feedback to keep the repulsive force acting between the cantilever tip and sample constant. This is the most common mode for AFMs and provides the highest level of resolution.

Dynamic Mode AFM

This mode vibrates the cantilever near its resonant frequency. In this state, moving the cantilever tip toward the sample varies the amplitude. This mode determines the displacement in the sample height direction by using this phenomenon to keep the amplitude constant.

Phase Mode

This mode detects the phase shift delay in the cantilever during dynamic mode scanning. This allows creating an image of differences in sample surface properties.

Lateral Force Mode (LFM)

By scanning in a direction perpendicular to the cantilever axis, this mode renders an image by detecting the amount of twist in the cantilever due to lateral forces (friction).

Force Modulation Mode

This mode repeatedly presses the probe against the sample during contact mode scanning, then detects the response by separating it into its amplitude and phase. This allows creating an image of differences in sample surface properties.

Force Curve (special order)

This measures and graphs the force acting on the probe as the distance between the probe and sample is varied.

Current Mode

This mode applies a bias voltage between the probe and sample during contact mode scanning and displays an image of the distribution in current flow detected.

Surface Potential Mode (KFM)

This mode measures the electric potential of the sample surface by applying an alternating current to a conductive cantilever and detecting the electric force acting between the sample surface and cantilever.

Magnetic Force Mode (MFM)

This mode scans the sample with a magnetized probe kept a constant distance from the sample. An image can be created from magnetic information of the sample surface obtained by detecting the magnetic force from magnetic leakage.

Vector Scanning (special order)

The scanning direction, force between the probe and sample, or the applied voltage can be programmed to allow scanning according to a program.

Observation in Solutions (petri dish type solution cell)

The sample is attached to the bottom of a small petri dish, which is then filled with solution. By scanning with the cantilever immersed in solution, AFM observations can be performed in solutions.

Observation during Electrochemical Reactions (electrochemical solution cell)

This cell is used for AFM observations of sample surface changes while an electrochemical reaction occurs in an electrolytic solution. The cell includes three standard electrodes (working electrode, counter electrode, and reference electrode).

You can find the data and the application, etc. obtained with SPM.

For Research Use Only. Not for use in diagnostic procedures.

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