SPM-9700HT

Scanning Probe Microscope

Functionality and Expandability to Meet a Wide Range of Requirements

With a generous selection of measurement modes, images can be obtained that show other information besides the sample shape, such as electrical current or electrical potential levels, or surface hardness or viscosity properties.

Standard specification
Contact Mode Dynamic Mode Phase Mode Lateral Force Mode (LFM)
Contact Mode
Dynamic Mode
Phase Mode Lateral Force Mode (LFM)
Standard specification
Optional Functions
Force Modulation Mode Nano 3D Mapping Current Mode Surface Potential Mode (KFM)
Force Modulation Mode
Nano 3D Mapping Current Mode
Surface Potential Mode (KFM)

Optional Functions
Magnetic Force Mode (MFM) Vector Scanning (special order) Petri Dish Type Solution Cell (special order) Electrochemical Solution Cell
Magnetic Force Mode (MFM)
Vector Scanning (special order)
Petri Dish Type Solution Cell (special order) Electrochemical Solution Cell

You can find the data and the application, etc. obtained with SPM. 

For Research Use Only. Not for use in diagnostic procedures.

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