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2017

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Nov 09, 2017

Shimadzu's New Metal Artifact Reduction Software Enables
Acquisition of Clear Images of Composite Parts with a
Microfocus X-Ray CT System

Example of the Reduction of Artifacts on an Evaluative Sample (Left: Original Image; Right: After Artifact Reduction)

Example of the Reduction of Artifacts on an Evaluative Sample
(Left: Original Image; Right: After Artifact Reduction)

Shimadzu has released its Metal Artifact Reduction Software. Intended for the Shimadzu inspeXio SMX-225CT FPD HR Microfocus X-ray CT system, this software significantly reduces artifacts occurring in CT images, enabling the acquisition of clear images.
A microfocus X-ray CT system is used to observe the internal structure of an object targeted for observation in 3D. It excels at failure analysis and inspections of aluminum die cast parts. However, in scans of composite parts composed of metals and resins, for example, materials with different X-ray absorption ratios, so-called artifacts or false images that do not actually exist, can occur, which interferes with the process of observation.
This newly developed software substantially reduces artifacts by using proprietary image processing matched to the materials in the object targeted for measurement. In tests conducted by Shimadzu, artifacts were reduced by approximately 90% in images of evaluative samples composed of aluminum, steel, and resin.

The inspeXio SMX-225CT FPD HR, which is an industry leader in terms of large field-of-view and high resolution, is Shimadzu's premier microfocus X-ray CT system. Utilizing the extended range of samples that can be observed with the Metal Artifact Reduction Software, this system should be appeal to companies in the automotive and electronics industries.

Features

This software performs image processing matched to the materials in the sample selected, without sacrificing the advantages of the inspeXio SMX-225CT FPD HR. As a result, even artifacts occurring in samples composed of composite materials can be substantially reduced. This makes it suitable for the observation of parts such as cable connectors, photo sensors, and lithium ion batteries. In addition, it displays the images during processing. This processing can be stopped and the images output at the level of artifact reduction the user wishes, which minimizes processing time.

inspeXio SMX-225CT FPD HR Microfocus X-Ray CT System

inspeXio SMX-225CT FPD HR Microfocus X-Ray CT System



For more details, visit
Metal Artifact Reduction Software

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