SPG-V500 Laser Spectrum Analyzer
High-Wavelength Resolution and Instantaneous Spectrometric Measurement at Wavelengths from 185 to 1095 nm
In addition to shortening the time taken for laser wavelength measurements, the instrument can help to visualize mode hopping and other longitudinal mode behavior, resulting in faster development speeds and reduced manufacturing costs for laser light sources and laser modules.
Typical Applications
Assessing Mode Hopping and Wavelength Behavior
- Improving the accuracy of laser sensing and laser measurements
- Laser speckle analysis for displays
- Evaluating the thermal characteristics of laser spectra
Observing the Wavelengths of Deep Ultraviolet (DUV) Lasers
- Accelerating the development of 266 nm wavelength conversion lasers
- Measuring excimer lasers (193 nm) and sterilization light sources (222 nm)
Speeding up Laser Optical Adjustments and Inspections
- Speeding up adjustment times for external cavity lasers
- Speeding up measurements of semiconductor lasers (LD) and surface-emitting lasers (VCSEL)
- Accommodating 100 % inspections of laser wavelengths for sensors (LiDAR) intended for self-driving systems
Features
- Instantaneous Spectrometric Measurements, Simultaneous Multi-Wavelength Measurements, and Real-Time Measurements
Using an array sensor, this instrument obtains an optical spectrum instantaneously, provides visualization of laser mode hopping and thermal and current characteristics, and speeds up measurement times.
- Heightens Wavelength Resolution with Multimode Fibers (MMF)
This instrument utilizes multimode fibers*1 to achieve a wavelength resolution of approximately 0.02 nm (Typ.), enabling the assessment of changes in fine peaks simply by orienting the optical fibers toward the measurement target*2.
- Wide Measurement Range Covering Ultraviolet (UV), Visible (VIS), and Near-Infrared (NIR) Light
Wavelengths from 185 to 1095 nm can be accommodated with a single unit, enabling measurements of everything from the 266 nm fundamental wave of deep ultraviolet lasers to wavelengths after wavelength conversion*3.
- *1: The recommended core diameter is 200 to 600 µm. Spatial incidence is also possible.
- *2: Even higher wavelength resolution measurements can be obtained by utilizing higher order light.
- *3: When measuring the fundamental wave, use an order separation filter to remove higher harmonics.
Specifications
| Optical connector*1 | FC connector | SMA connector |
|---|---|---|
| Measurement wavelength range*2, *3 | 185 to 1095 nm | |
| Real-time measurement wavelength band*4 | 31.8 to 8.2 nm | |
| Wavelength resolution*5 | ≦ 0.04 nm | |
| Wavelength accuracy*5, *6 | ±0.4 nm | |
| Dimensions and weight | W270 × D650 × H211 mm, 18.7 kg | |
| Accuracy guaranteed temperature | 23±4 ℃ | |
| Operating temperature/humidity*7 | 23±10 ℃, 30 to 70 % | |
- *1: Install a optical fiber cable (sold separately) that meets each specification. Recommended core diameter is 200 to 600 µm. This product supports laser light input up to 10 mW.
- *2: The set wavelength range is 190 to 1092 nm. The set wavelength is the wavelength measured near the center of the sensor.
- *3: Use an order-sorting filter if the measurement light includes light with the n-th orders (such as 1/2, 1/3...) of the measurement wavelength.
- *4: Wavelength interval that can be measured in real time. It is determined for each set wavelength.
- *5: Inspection wavelengths are 253.7 nm, 546.1 nm, 912.3 nm, and 1092.1 nm. The value around the center of the sensor.
- *6: The values are after using the origin adjustment function of the software.
- *7: No condensation, dust, or vibration.