Product

Scan/SIM simultaneous high-speed data acquisition capability

The FASST (Fast Automated Scan/SIM Type) measurement method enables simultaneous Scan/SIM measurement. This feature leads to high-sensitivity analysis having fragment information on multiple compounds.
In addition to the application of simultaneous analysis for multiple compounds, FASST (Fast Automated Scan/SIM Type) is applicable for other fields such as sample testing and forensics because FASST makes it possible to detect unexpected additional compounds during its high-sensitive measurement.

Taking advantage of both merits of Scan and SIM measurement

This revolutionary technique makes the best use of the features (*) of both SIM and Scan, using SIM to perform a high-sensitivity measurement of compounds measured at insufficient sensitivity by the scan method, and using scan measurement to detect additional non-target compounds that may not be detected by SIM measurement.

(*) Features and limitation of Scan and SIM

Scan measurement

• Qualitative information obtained from the mass spectrum
• Mass spectral information about compounds　other than target analytes
• Less sensitivity compared with SIM　measurement

SIM measurement

• Excellent sensitivity compared with Scan measurement
• No Mass Spectrum. Information obtained is limited only to target compounds