Product
Laboratory Instruments
Surface Analysis Apparatus
Scanning Probe Microscope(SPM)
SPM-9600
“Scanning probe microscope” (SPM) is the general term used to describe a microscope that allows the high-magnification observation of 3D shapes via the scanning of a sample surface with a microscopic probe. The SPM-9600 is a next-generation SPM, and symbolizes the evolutionary development of products currently enjoying an excellent reputation for high-speed observation and simple operation.
Higher Quality Images
The SPM-9600 is a next-generation instrument that adds greater measurement capabilities to basic observation. With this unit the percentage of digital processing performed via control circuits is 40% greater than with previous Shimadzu products. The resulting signal processing system to install newly developed VBDF (Variable Bandwidth Digital Filter) produce clearer, higher-quality images.
A Wide Variety of Measurement Modes
Contact, dynamic, and phase modes are all included as standard features. Easily add additional measurement modes, including force modulation, magnetic force (MFM), current, and surface potential (KFM), easily connect expansion units, such as for nano-indentation or Q-control systems, and easily upgrade your level of environmental control. The SPM-9600 can meet your application requirements, whether you are a first-time or an experienced user.
Simple Operation
The SPM-9600 is equipped with an easy-to-use interface. Also, the software’s automation functions ensure operation is easy, even for first-time users. The SPM-9600's rigid design is highly resistant to vibration and noise, enabling the fast observation of a wide variety of samples, without having to worry about disturbances.
Expandability
This photograph shows a combination example.
The scanning probe microscope SPM-9600 can be upgraded to the environment controlled scanning probe microscope WET-SPM series by adding the optional environment controlled chamber.
General Specifications
| Operation Modes | Standard : Contact, dynamic, phase Options: Force modulation, current, magnetic force (MFM), surface potential (KFM), lateral force (LFM) |
|
|---|---|---|
| Resolution | Horizontal: 0.2nm; Vertical: 0.01nm | |
| Maximum Scanning | 30 µm x 30 µm x 5µm (standard) | |
| Range (X, Y, Z) | 125 µm x 125 µm x 8µm (optional) 55 µm x 55 µm x 15µm (optional) | |
| Maximum Sample Dimensions | 24(dia.) mm x 8mm | |
| Sample exchange | Head-slide mechanism | |
| Beam-splitter Slide Mechanism | Incorporated in AFM head | |
Installation Environment
Ideally, the air conditioning system should maintain the following installation room conditions:
Temperature: 23 ± 5°C
Humidity: 60% max.
Power Supply
The following power supply is required to operate the SPM-9600:
Single-phase 100 V AC to 120 V AC / 200 V AC to 240 V AC, 50/60 Hz, 10 A, single circuitGround: Ground at a resistance of 100 Ω max.
Size and Weight of Units
SPM unit: 180 (W) x 255 (D) x 260 (H) mm, 5.5 kg
Control unit: 250 (W) x 420 (D) x 454 (H) mm, 18.5 kg
* All configurations and specifications are subject to change without notice.
