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Features
Measures refractive index over the UV, visible, and near-IR ranges.
Measured angle is clearly displayed on a dedicated counter.
Minimum deviation method offers highly accurate refractive index measurements.
Excellent ±1" angular measurement accuracy. The 1/2-ratio gear system and photoelectric detection easily determine the angle of minimum deviation.
Angular measurement of transparent samples, such as new materials and glass, across the UV, visible, and near-IR ranges.
Variable to user-defined wavelength specifications by adding a laser diode or other light source.
| Measurement accuracy | Angular measurement accuracy: ±1" Refractive index measurement accuracy: ±0.00001 |
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|---|---|---|
| Display | Angle counter digital display | |
| Measurement wavelength range | 254 nm to 2500 nm (with IR option) | |
| Slit | Max. effective blade length: 15 mm Min. reading: 0.005 mm |
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| Objective lens | Focal distance: 500 mm Brightness: F/10 |
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| Eyepiece lens | Autocollimation eyepiece lens Focal distance: 16 mm |
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| Angle detector | High-accuracy rotary encoder | |
| Measurement method | Minimum deviation method PC calculates refractive index from measured sample peak angle and minimum deviation angle. |
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| Gear system | Gear ratio: 1/2 Accuracy: 20" min. | |
| Light source | Standard: automatic spectrum light-source unit - He, H2, high-pressure Hg, Cd Optional: automatic spectrum light-source unit - semiconductor laser 1300, 1550 |
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| Detector | VIS, UV: photomultiplier tube IR: thermoelectrically cooled Pbs detector |
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| Output format | Lock-in amplifier | |
| Size and weight | 1210 x 550 x 650 mm, 130 kg | |
The system can be customized to your requirements. Consult your Shimadzu representative.