Product

Optical Devices

Precision Refractometers

Automatic refractometer

KPR-200 Precision Refractometer

Features

Minute sample size (3 dia. x 1t mm) can be measured!

  • Just load a sample and press the Start button. Automatic measurement starts at the preset conditions by P.C. displaying the measured data at once.
  • Automatic light-source detection and computer control achieve high accuracy and repeatability.
  • Measurement at three wavelengths in just one minute.
  • The Energy distribution graph makes it possible to estimate the existence of double refraction.
  • The use of a refractive liquid between the sample and the V-block prism allows measurement with frosted surface if the two faces are machined to 90°.
  • Easy operation by the mouth to select measuring parameter.
  • Up to ten wavelengths can be added, allowing the operator to select the required wavelength freely. (Note.1)
  • Note1：Some wavelength combinations may be un available.

Applications

Refractive index measurements for transparent liquids and transparent samples such as new materials and glass. Birefringence index measurements.

Operation Screens

The Windows-based graphical control software offers easily understanding of operations. Exporting data to commercial spreadsheet software is ideal for report generation.

Operation Screens

The Windows-based control software offers easily understood, graphical operations.Exporting data to commercial spreadsheet software is ideal for report generation.

Specifications

Measurement range Refractive index measurement: 1.25 to 2.00 (No.1 prism: 1.25 to 1.70; No.2 prism: 1.50 to 2.00)
Measurement accuracy Refractive index: ±0.00005 (at 23oC room temperature)
Repeatability Refractive index: ±0.00002 (at 23oC room temperature)
Measurement wavelength
range		 365 nm to 1550 nm
Measurement wavelength Standard
d-line    587.6nm He lamp
C-line    656.3nm H2 lamp
F-line    486.1nm H2 lamp
Options
g-line    435.8nm Hg lamp
e-line    546.1nm Hg lamp
h-line    404.7nm Hg lamp
i-line    365.0nm Hg lamp
r-line    706.5nm He lamp
He-Ne    632.8nm He-Ne laser
L.D    780　nm semiconductor laser
L.D    830 nm semiconductor laser
C' line    643.9nm Cd lamp
F' line    480.0nm Cd lamp
L.D    1310 nm semiconductor laser
L.D    1550 nm semiconductor laser

Click here to view options page.

The system can be customized to your requirements. Consult your Shimadzu representative.
Shimadzu can conduct refractive index measurements for you.
Costs depend on the number of measurements, measured temperature, and machining of the samples. Consult your Shimadzu representative.

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