| Analysis/Evaluation Details | Evaluation Instrument |
|---|---|
| Thin Si wafers, thin films, film microhardness, compression rupture strength testing | Hardness Testers (Strength properties) |
| Adhesive film peeling testing | Peeling Test Devices |
| Strength testing and tensile fatigue testing of materials for flexible printed circuits | Fatigue Test Devices |
| Evaluation of film crystallinity, and heat-resistant properties | Thermal Analyzers |
| Thermal expansion testing of glass and films | |
| Composition and degradation analysis of polymer substrates and materials | Infrared Spectrophotometers |
| Composition and degradation analysis of transparent adhesive film such as EVA | Gas Chromatograph Mass Spectrometers |
This page may contain references to products that are not available in your country. Please contact us to check the availability of these products in your country.