June 20, 2013 | News & Notices Release of the SMX-1000 Plus/1000L Plus Microfocus X-Ray Inspection Systems Achieving Simpler Measurements and Even Better Operability
Shimadzu has now released the SMX-1000 Plus and 1000L Plus series of microfocus X-ray inspection systems. Thanks to automatic settings for measurement parameters and the adoption of a large monitor, these systems offer even better operability than conventional models.
Microfocus X-ray inspection systems are the typical instruments used for non-destructive inspections. They display fluoroscopic images created by penetrating the object under examination with X-rays from a very tightly focused point of origin. In manufacturing lines in the electrical and electronics industry, they are utilized for pre-shipment inspections of products and surface mounted parts, and for analyzing failures in defective products.
The newly released SMX-1000 Plus/1000L Plus systems inherit the features of the conventional SMX-1000 and 1000L models so popular with users, including clear, distortion-free images, inclined fluoroscopy, and the exterior navigation function. At the same time, these new systems achieve shorter measurement times and even better operability.
Thanks to the large monitor and simple button layout, the visibility and operability are even better. At the same time, parameter settings for BGA measurements and area ratio measurements, which in conventional models need to be configured manually, have now been automated. As a result, procedures that conventionally required about 60 seconds can now be completed in less than a second. In addition, the exterior navigation function has been improved, so it can be used to specify the entire mobility range of the observation stage, thereby contributing to more efficient inspections.
Features of the New Systems
(1) Further Improved Operability and Visibility
The monitor has been expanded from the conventional 17 inch size to a 23 inch wide format, and a simple and easy-to-use button layout has been adopted. As a result, the popular operability of conventional models has been further improved. The fluoroscopic images, exterior images, and reference images are all now larger than before, providing better visibility. At the same time, the maximum magnification has been improved from the conventional 127 times to 161 times.
(2) Simplified Operations for BGA and Area Ratio Measurements
BGA (ball grid array) and area ratio measurements have been improved, and the operating procedures have been significantly simplified. Conventionally, the complicated measurement parameters needed to be configured manually, but thanks to Shimadzu's proprietary image processing algorithm, these settings have now been automated. Procedures that conventionally required about 60 seconds including the operating time can now be completed in less than a second. At the same time, more consistent results can be obtained, without the influence of individual differences between users. In addition, multiple settings can be stored, and then appropriate settings for individual inspection targets can be called up.
(3) Expansion of the Exterior Images for Full Range Positioning
The exterior navigation function, a forte of conventional models, has been improved to expand the range covered by the exterior image. Previously, the imaging range did not completely cover the 300 x 350 mm movable range of the observation stage (520 x 620 mm for the SMX-1000L Plus) and, therefore, it was not possible to move the exterior navigator to some areas along the edge of the moveable range. However, the new models now allow specifying anywhere in the entire movable range.
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Shimadzu SMX-1000 Plus/SMX-1000L Plus Microfocus X-Ray Fluoroscopy System