Energy dispersive X-ray Fluorescence spectrometer
Additional Function Kit for the EDX-LE
Add general analysis functions to the EDX-LE RoHS/ELV screening model.
Features available after installing the kit:
- Elements not subject to RoHS/ELV regulations can be identified and quantitated.
- Detailed measurement and analysis conditions can be created according to the application.
- Film FP method allows analysis of multilayer film thickness, composition, and deposit volume.
- Matching functions offer metal type identification and product identification.