Energy dispersive X-ray Fluorescence spectrometer

Additional Function Kit for the EDX-LE

Add general analysis functions to the EDX-LE RoHS/ELV screening model.

Features available after installing the kit:

  1. Elements not subject to RoHS/ELV regulations can be identified and quantitated.
  2. Detailed measurement and analysis conditions can be created according to the application.
  3. Film FP method allows analysis of multilayer film thickness, composition, and deposit volume.
  4. Matching functions offer metal type identification and product identification.

Example of Measurements Using the Additional Function Kit

Qualitative/Quantitative Analysis

Thin Film Analysis

Matching (steel type identification, product identification)

For Research Use Only. Not for use in diagnostic procedures.

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