Measurement of Transmittance and Reflectance Spectra of Optical Materials (UV)
A UV-NIR spectrophotometer can precisely measure transmittance and reflectance spectra over a wide range of wavelengths, from the near-infrared region to the ultraviolet region.
In this example, a UV-3700 UV-VIS-NIR spectrophotometer was used to measure the transmittance spectrum of a CD substrate and the reflectance spectra of silicon wafers.
The UV-3700 allows nondestructively measuring even very large samples, and performs spectrophotometric measurements across a wide wavelength range from the ultraviolet to the infrared.
Using materials with little absorption of deep-ultraviolet (DUV) light in the light source, detector, and integrating sphere and nitrogen purging all light paths including the monochromator and sample chamber permits measurements across a wide wavelength range from 165 to 3300 nm (using DUV model with options).