SPMScanning probe microscopeDamage

Shimadzu SPM models also makes it possible to use various SPM techniques to obtain images based on information from signals indicating the physical properties of sample surfaces, such as electrical current, electrical potential, hardness, or viscoelasticity. (Some of these features are optional.)


System Functions

SPM is a generic term for all microscopes used to observe sample surfaces three-dimensionally by moving a tiny needle (probe), with a tip radius of only a few dozen nanometers, close to the sample surface.

System Functions

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