Carbon Nanotube | Dispersion | Observations and Potential Measurements

The potential at and around carbon nanotubes (CNTs) can be measured on an electric force microscopy (EFM) image taken with a scanning probe microscope (SPM).
Fig. 1 shows a sample topographic image and an EFM image for an 8 wt% SWNT/acrylic resin sample.
Fig. 2 also shows an example of EFM measurements. The sample is a mixture of purified single-walled carbon nanotubes (HiPco) and DNA solution spin-coated onto a mica substrate. (Manufactured by Carbon Nanotechnology Inc.)

SWCNT/acrylic resin 8 wt% topographic image,SWCNT/acrylic resin 8 wt% EFM image

Fig. 1 Sample Topographic Image and EFM Image for 8 wt% SWNT/Acrylic Resin Sample (Samples supplied by Aida Nanospace Project, Japan Science and Technology Agency)

Fig. 2 EFM Measurements (Purified SWNTs (HiPco) and DNA Solution Spin-Coated onto a Mica Substrate) (Samples supplied by Shinohara Laboratory, Graduate School of Science, Nagoya University.

Scanning Probe Microscope


The scanning probe microscope (SPM) scans sample surfaces with a microscopic probe to provide high-magnification 3-dimensional observations.
The SPM-9600 is the next generation of spanning probe microscope that represents further evolution of previous models that were highly regarded for rapid observations and simple operation.

For Research Use Only. Not for use in diagnostic procedures.

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