IC Surface Observations

The scanning electron microscope irradiates a sample with a nano-order focused electron beam to reveal its detailed shape and structure. It can identify the type, quantity, and distribution of the elements existing in nano-order regions.

Here, the surface of an IC was observed.

Images of IC Surface

Scanning Electron Microscope

Scanning Electron Microscope

It irradiates a sample with a nano-order focused electron beam to reveal its detailed shape and structure. The sample irradiated by the electron beam generates characteristic X-rays according to the elements it contains. Detecting these characteristic X-rays identifies the type, quantity, and distribution of the elements existing in nano-order regions.

For Research Use Only. Not for use in diagnostic procedures.

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