EDXRF and WDXRF Analysis of Cd

It have been a must to analyzing the heavy elements in the products, the industrial waste and thematerial for re-use as the interest for the environment has been build up in the recent. Then wereport the lower limits of detection (Minimum Detection Limits) of Cd in many materials withdifferent measurement conditions.

Content Type:
Application
Document Number:
SCA_125_020
Product Type:
Elemental Analysis, Energy Dispersive X-ray Fluorescence Spectroscopy
Keywords:
Electronics, Electronic, Environment, Regulatory Test (RoHS, ELV, REACH, etc), Electronics/Electronic device, Semi-conductor, Electronic parts, Mounting board, Printed Circuit Board, EDX-700
Language:
English
File Name:
appl_edx_cadmium_06d_en.pdf
File Size:
45kb

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For Research Use Only. Not for use in diagnostic procedures.

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