EDXRF Analysis of Orchard leaves

Orchid leaves are used to determine theaccuracy of XRF instruments in evaluatingtrace elements. The orchard leaf, isparticularly useful, in extracting a range ofelements in the ppm level from thesurrounding soil. The orchard leaves usedhere come from NIST Certified ReferenceMaterials (NIST-SRM Program), and areverified by various methods, including wetchemistry.

Content Type:
Application
Document Number:
SCA_125_003
Product Type:
Elemental Analysis, Energy Dispersive X-ray Fluorescence Spectroscopy
Keywords:
Food and Beverages, Environment, Agricultural, Soil, Fertilizer, Waste Material Test, EDX-700
Language:
English
File Name:
appl_edx_orchard-leaves_06d_en.pdf
File Size:
131kb

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For Research Use Only. Not for use in diagnostic procedures.

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