Quantitative Analysis of Lead in Bismuth Bronze - Matrix Elements/Profile Correction and Comparison with AA -
Metal samples are generally measured in the plane of cutting and polishing, but there are cases in which the samples are irregular shapes such as chips and wiring. For irregularly shaped samples with coexisting elements, shape correction is required in addition to the overlap correction described above.
This article introduces an examination of the quantitative analysis precision when applying these corrections to a flatsurface sample and chip sample through a comparison with atomic absorption (AA) analysis.
- Content Type:
- Application
- Document Number:
- LAAN-A-XR-E037
- Product Type:
- Elemental Analysis, Energy Dispersive X-ray Fluorescence Spectroscopy, Atomic Absorption Spectroscopy
- Keywords:
- Lead, Bismuth interferes, Environment, Hydrocarbon Processing Industry (Petrochemical, Chemical), Electronics, Electronic, Regulatory Test (RoHS, ELV, REACH, etc), Metals, AA-7000, EDX-8000
- Language:
- English
- File Name:
- jpq217003.pdf
- File Size:
- 166kb