Analysis of Silicon Surface by Single Reflection ATR

We introduce here the analysis of a silicon surface as examples of showing the advantage of “good contact” between the sample and the ATR crystal afforded by the single reflection method.

Content Type:
Application
Document Number:
LAAN-A-FT-E010
Product Type:
Molecular Spectroscopy, FTIR Spectroscopy
Keywords:
Molecular Spectroscopy, Electronics, Electronic, Semi-conductor, Electronic parts, Mounting board, Printed Circuit Board
Language:
English
File Name:
a377.pdf
File Size:
39kb

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