Printed Circuit Board Defect Analysis

Contaminants and stains on printed circuit boards can cause conduction defects. Identifying these materials is an important part of preventing the same problem occurring again. We describe a qualitative analysis of contaminants found on a printed circuit board performed using the AIM-9000 Infrared Microscope, which is specially designed for defect analysis.

Content Type:
Application
Document Number:
LAAN-A-FT-E069
Product Type:
Molecular Spectroscopy, FTIR Spectroscopy
Keywords:
Printed circuit board, MicroSD card, Terminal, Contaminant, Stain, Defect analysis system, Wide field camera, Specular reflection, ATR, Electronics, Electronic, AIM-9000
Language:
English
File Name:
jpa216026.pdf
File Size:
702kb

Free Download

For Research Use Only. Not for use in diagnostic procedures.

This page may contain references to products that are not available in your country. Please contact us to check the availability of these products in your country.

Top of This Page