Printed Circuit Board Defect Analysis

Contaminants and stains on printed circuit boards can cause conduction defects. Identifying these materials is an important part of preventing the same problem occurring again. We describe a qualitative analysis of contaminants found on a printed circuit board performed using the AIM-9000 Infrared Microscope, which is specially designed for defect analysis.

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Molecular Spectroscopy, FTIR Spectroscopy
Printed circuit board, MicroSD card, Terminal, Contaminant, Stain, Defect analysis system, Wide field camera, Specular reflection, ATR, Electronics, Electronic, AIM-9000
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