Reflectance Measurement of Thick Samples Using an Infrared Microscope
The AIM-9000 automated micro analysis system can normally measure samples with a thickness of up to approximately 10 mm by placing the sample on the stage. However, by removing the lower cassegrain (condenser-objective), samples with a thickness of up to 40 mm can be placed for reflectance and ATR measurement.
This article introduces examples of reflectance measurement of samples with a thickness larger than 10 mm.
- Content Type:
- Application
- Document Number:
- LAAN-A-FT-E079
- Product Type:
- Molecular Spectroscopy, FTIR Spectroscopy
- Keywords:
- Infrared Microscope, Reflectance measurement, ATR measurement, Electronics, Electronic, Food and Beverages, Hydrocarbon Processing Industry (Petrochemical, Chemical), Pharmaceutical, Life Science, IRTracer-100, AIM-9000
- Language:
- English
- File Name:
- jpa217017.pdf
- File Size:
- 1,260kb
