Imaging with the AIM-9000 Infrared Microscope - Defect Analysis in the Electrical and Electronic Fields -
This article introduces example analyses regarding a mixed contaminant and a defect on an electronic substrate.
- Content Type:
- Application
- Document Number:
- LAAN-A-FT-E092
- Product Type:
- Molecular Spectroscopy, FTIR Spectroscopy
- Keywords:
- Infrared Microscope, Defect analysis, Mapping measurement, Electronics, Electronic, Hydrocarbon Processing Industry (Petrochemical, Chemical), AIM-9000
- Language:
- English
- File Name:
- jpa218010.pdf
- File Size:
- 241kb
