When contaminants are generated, it is important to quickly identify them, ascertain the source, and take measures against further occurrence. Energy dispersive X-ray spectroscopy (EDX) and Fourier transform infrared spectroscopy (FTIR) are very effective techniques for the identification of contaminants. Using EDX and FTIR together provides a simple method of obtaining information on both the elements and compounds present in a contaminant. However, making a comprehensive assessment of sets of EDX and FTIR data to identify a contaminant requires substantial experience and knowledge.
EDXIR-Analysis has been recently developed by Shimadzu as software specially designed to identify contaminants to a high degree of accuracy, and contains within it a database of actual contaminant samples and the cumulation of Shimadzu's expertise. In this article, we will describe an example contaminant analysis and in doing so demonstrate the functions and features of EDXIR-Analysis software.