Analyzing Foreign Matter in the Glass Substrate for Liquid Crystal Displays

Since its usefulness as a glass substrate cannot be upheld if the glass has internal defects such as bubbles or foreign matter, has scratches on its surface, or has other defects due to foreign matter, it is very important that the cause of such defects be investigated thoroughly. Foreign matter in the glass can be identified by analyzing the foreign matter and determining when it was generated and where the contamination occurred, from the raw material stage to the melting process.
We here introduce an example of the analysis of a TFT (Thin-Film Transistors) glass substrate using EPMA.