Evaluation of the Local Elastic Modulus of Polymeric Materials Using SPM
A scanning probe microscope(SPM) has a resolution in the nanoscale and is capable of detecting minute forces in the order of nN and below. It is therefore gaining attention as a means for measuring the local physical properties of polymeric materials.
In this article, we introduce evaluations of the local elastic modulus of polymeric materials using SPM.
- Content Type:
- Application
- Document Number:
- LAAN-A-SA-E003
- Product Type:
- Surface Analysis
- Keywords:
- Scanning probe microscope (SPM), Local elastic modulus, Adhesion force, Polymeric materials, Hydrocarbon Processing Industry (Petrochemical, Chemical), Pharmaceutical, Life Science, Rubber, Resin, Plastics, Petrochemical, Polymer, SPM-9700HT
- Language:
- English
- File Name:
- jpq618001.pdf
- File Size:
- 851kb
