FLM-UVPC Film Thickness Measurement Software

Diffuse Reflectance Measurement

This software calculates film thickness from the peak positions of the interference pattern caused by the film. Film thickness is calculated by the method of least square using the wavelengths of the all peaks and valleys within a specified wavelength range.

 
  • For UV-2450/2550/2600/2700/3600 Series, SolidSpec

  • PC software
    (compatible OS:Windows 10 (64bit) / Windows 7 (64/32bit))

 

For Research Use Only. Not for use in diagnostic procedures.

This page may contain references to products that are not available in your country. Please contact us to check the availability of these products in your country.

Top of This Page