Shimadzu’s New EDX-8100 Energy Dispersive X-Ray Fluorescence Spectrometer Enables Analysis of Liquid Samples with High Sensitivity by Helium Purging
Shimadzu announces the release of the EDX-8100 energy dispersive X-ray fluorescence spectrometer. This instrument offers enhanced versatility with the ability to analyze even light elements in liquid samples with high sensitivity by helium purging.
In addition to retaining the excellent analysis capabilities, operability, and expandability of the EDX-8000 energy dispersive X-ray fluorescence spectrometer, the product’s improved detector provides compatibility with helium purging. When configured with an optional helium purge unit, the EDX-8100 is capable of the high-sensitivity analysis of elements, including light elements (fluorine (F) to aluminum (Al)), in samples that cannot be depressurized to a vacuum state, such as liquid samples and those containing water or oils. In addition to increased use at public research institutions, universities, and contract research organizations due to the range of samples that can be analyzed, EDX-8100 is expected to contribute to quality control for silicon coating agents and fluorine cleaners in fields such as chemistry and materials research.
Background to the Development
Energy dispersive X-ray fluorescence (ED-XRF) spectrometers can analyze the composition and concentration of elements contained in samples by detecting fluorescence X-rays generated from the surface of samples irradiated with X-rays. They can be used to easily and non-destructively analyze samples in a wide range of forms, including solids and powders. The EDX-7000 and EDX-8000 energy dispersive X-ray fluorescence spectrometers, which Shimadzu released in September 2013, are widely used in a variety of industries, and a total of more than 1000 units have been sold world wide.
With ED-XRF spectrometers, the detection of light elements, which are sensitive to the impact of the measurement atmosphere, requires measurements with the sample chamber under vacuum conditions. In contrast, for gas-generating samples and liquid samples, it is more effective to purge the air inside the sample chamber with helium gas. The release of the EDX-8100, which is compatible with helium purging, enables the high-sensitivity analysis of light elements in liquid samples.
The ability to start analysis quickly, without complicated pretreatment, is a key feature of ED-XRF spectrometers. With this feature and the increase in the forms of samples that can be measured with high sensitivity, Shimadzu is deploying energy dispersive X-ray fluorescence spectrometers in an even wider range of fields.
The optional helium purge unit allows the analysis of the elements sodium (Na) to aluminum (Al) in liquid samples at up to three times the sensitivity provided by our conventional products. Further, this is the first Shimadzu energy dispersive X-ray fluorescence spectrometer that can analyze fluorine in liquid samples. For solids and powders, the elements carbon (C) to uranium (U) can be detected by adding a vacuum measurement unit. In addition, in combination with the small spot analysis kit, this instrument supports the accurate analysis of small samples with a diameter of 1 mm or less. With its wide detection range, and compatibility with various measurement atmospheric conditions and various types of sample forms and sizes, the EDX-8100 offers the versatility to address a wide range of application requirements.
For more details, visit
EDX-8100 Energy Dispersive X-ray Fluorescence Spectrometer