Micro Autograph MST-I

Micro Strain Tester

Micro Displacement and Test Forces Controlled and Measured to High Precision In recent years, devices and components have become increasingly downsized and are being mounted at higher densities due to the trend towards thinner, lighter and smaller electronic devices equipment. Accompanying this, in the field of strength evaluation testing, there has been an increasing need for testing machines that can control and measure displacement and test forces on micro samples in the several µm or several mN micro regions and that can evaluate strength to high precision. The Shimadzu Micro Autograph MST-I has been developed and put onto the market in response to this need for a micro strength evaluation testing machine primarily in the electronic components sector. * The photograph shows the table, stereo microscope, micro-chuck, and PC options.


  • High-Precision Displacement Measurement

    A high-precision linear sensor ensures high displacement measurement precision (displacement display resolution of 0.02 µm, and displacement measurement precision of ±0.2 µm up to 5 mm displacement).
  • Measurement of Micro Test Forces

    A wide range of load cells from 0.5 N to 2 kN assures a testing force measurement precision of ±1 % from a minimum load of 2 mN.
  • High-Rigidity Frame

    The frame has an extremely high rigidity of 45 kN/mm so that highly reliable micro displacement measurement can be performed.



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