Nano 3D Mapping

Nanophysics Evaluation System

Visualizing the Physical Properties of Nano-Regions on Surface or Interface

The physical properties of external or boundary surfaces can be evaluated by measuring the force acting on a
scanning probe microscope cantilever probe as its distance from the sample is varied (force curve measurement).

  1. The adhesive force and Young's modulus can be evaluated at a specific target location by measuring the force curve at that point (point analysis).
  2. By acquiring force curves at multiple points, a two-dimension map of the physical properties can be created (mapping analysis).
  3. Acquired data can be displayed three-dimensionally, or specific data can be extracted for data analysis (3D analysis).

Evaluating Physical Properties at Any Point on a Film

Force curves were measured at arbitrary points on a film surface. The results show that the adhesive force is different at the respective points.
Similarly, physical properties can also be evaluated on small soft samples, such as biopolymers.

3D Analysis

All force curves acquired for mapping are saved.
Therefore, the data can be displayed three-dimensionally, or specific cross sections can be extracted for data analysis.

Mapping the Physical Properties of Plastic Films

Mapping analysis can be used to measure adhesive force and Young's modulus as well as surface topography. The figure shows a quantitative visualization of the Young's modulus within a localized area only 300 nm wide on a plastic film surface. (Sample source: MORESCO).

Application example: Evaluating the uniformity of a polymer material surface

Adhesive Part of an Adhesive Tape

These images are from an evaluation of the adhesive part of an adhesive tape. They show that the adhesive force is distributed non-uniformly. This demonstrates how the system can be used to evaluate adhesive properties, which were difficult to evaluate using conventional methods.

Main Specifications

Force Curve
  Scan (Z) range Settings method Specify end point and width, and automatically track end point
Range Depends on scanner
Scanning speed Frequency setting 0.1 to 100 Hz
Frequency setting step size 0.1 Hz
XY movement Settings method Numerical entry, or speciĀƒed with mouse on SPM image
Range Depends on scanner
Display SPM image data, force curve waveform, measurement parameters, and data analysis results

Measurement Physical quantities measured Adsorption force, slope of force curve, Z-position, or elastic modulus
Range Depends on scanner
512 x 512, 256 x 256, 128 x 128, 64 x 64, 32 x 32, 16 x 16
8 x 8, 4 x 4, 2 x 2
Display SPM image data, force curve waveform, and measurement parameters

For Research Use Only. Not for use in diagnostic procedures.

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