SPM-8100FM

High Resolution Scanning Probe Microscope

The Principle of FM-Type AFM

The frequency of a vibrating cantilever is measured in dynamic mode, and interactions with the sample are detected.
Specifically, the cantilever is moved in a non-contact state, so that the cantilever frequency shift (Δf) is constant. This enables highly sensitive force detection, 20 times better than with existing methods, thereby improving the image resolution.

For Research Use Only. Not for use in diagnostic procedures.

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