High Resolution Scanning Probe Microscope
The Principle of FM-Type AFM
The frequency of a vibrating cantilever is measured in dynamic mode, and interactions with the sample are detected.
Specifically, the cantilever is moved in a non-contact state, so that the cantilever frequency shift (Δf) is constant. This enables highly sensitive force detection, 20 times better than with existing methods, thereby improving the image resolution.