Observation Examples of Thin Film

Phase image and photo-assisted KFM measurements of zinc oxide: copper phthalocyanine bulk-heterojunction layer prepared by simultaneous vacuum evaporation process

Fig. 1 PKFM Diagram

Fig. 2 Potential (3D)

Fig. 3 Height

Fig. 4 Phase

The change in the surface potential originated from the increase in free carrier by irradiating light could be measured with a photo-assisted kelvin force microscopy (PKFM) represented by Figure 1 for a Ga-doped zinc oxide: Cu-phthalocyanine bulk-heterojunction layer prepared by a simultaneous vacuum evaporation process, as shown in Figure 2. The distribution of zinc oxide (bright part) and Cu-phthalocyanine (dark part) could be observed for the corresponding topography image (Figure 3) by the phase imaging with a dynamic mode atomic force microscopy, as shown in Figure 4.

M. Izaki, et al., Hybrid zinc oxide: Cu-phthalocyanine bulk-heterojunction photovoltaic device, RSC Advance, 4, 14956 (2014)

(Courtesy of Prof. Masanobu Izaki, National University Corporation, Toyohashi University of Technology Graduate School of Engineering, Faculty of Mechanical Engineering)

For Research Use Only. Not for use in diagnostic procedures.

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