Scanning Probe Microscope

Observation Modes Standard Contact
Lateral Force (LFM)
Force Modulation
Optional Magnetic Force (MFM)
Surface Potential (KFM)
X, Y 0.2 nm
Z 0.01 nm
SPM Head
Displacement detection system Light source/Optical lever/Detector
Light source Laser diode (ON/OFF)
Irradiates cantilever continuously, even while replacing samples.
Detector Photodetector
Scanner Drive element Tube piezoelectric element
Max. scanning size (X, Y, Z) 10 µm x 10 µm x 1 µm (standard)
30 µm x 30 µm x 5 µm (optional)
125 µm x 125 µm x 7 µm (optional)
55 µm x 55 µm x 13 µm (optional)
2.5 µm x 2.5 µm x 0.3 µm (optional)
Max. sample size 24 mm dia. x 8 mm
Sample replacement method Head-slide mechanism with integrated displacement detection system and cantilever
Samples can be replaced without removing cantilever.
Sample securing method Magnet
Z-Axis Coarse Adjustment Mechanism Method Automatic, using stepping motor
Fully automatic, regardless of sample thickness
Max. stroke 10 mm
Signal Display Panel Displayed quantity Total incident light to detector (digital display)
Vibration Isolation System Vibration Damper Built into SPM unit
Optical Microscope Observation Method Beam-splitter slide mechanism
Specialized Enclosure Method Not necessary or environment controlled chamber is used.
Environment Control Method Chamber can be added without modifying SPM unit.

For Research Use Only. Not for use in diagnostic procedures.

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