January 31, 2017 | News & Notices Industry First EDXIR-Analysis Software Package Enables
Efficient Contaminant Analyses and Confirmation Tests

EDXIR-Analysis EDX-FTIR Contaminant Finder/Material Inspector

Shimadzu Corporation announces the release of the industry's first EDX-FTIR contaminant finder/material inspector, EDXIR-Analysis. This software package makes possible the integration and analysis of data acquired from both an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared (FTIR) spectrophotometer.

This proprietary software was developed by Shimadzu in order to meet the needs of users who perform contaminant analysis and confirmation tests using EDX and FTIR techniques. For contaminant analyses, the software integrates data acquired with EDX and FTIR so it can be analyzed using one platform. Then, by comparing the data with data found in an included specialized contaminant library, candidate contaminants are viewed in order, depending on the degree of matching. Also, for confirmation tests, the acquired data is compared with one item of data from the library, and the degree of matching between the two is expressed in numerical form.

Background to the Development

In recent years, among food manufacturers, chemical manufacturers, and contract inspection organizations, there has been an increase in demand for analyses of contaminants, whether they have been mistakenly introduced as components or have adhered to the product. The increasing importance of inspections to determine if raw materials or other materials conform to specifications and meet the desired quality, after they have been delivered by suppliers, has also become more evident. In conjunction with this, increased attention has focused on EDX, which is suitable for the identification of metals and other inorganic elements, and FTIR, which excels at the analysis of polymeric materials and organic substances. Cases where the same sample is analyzed by both instruments has increased. However, in addition to the fact that a separate analysis of the acquired data needs to be performed on each instrument, derivations from the data of the two instruments that result in a final identification and degrees of matching are essentially left up to the analyst.

Due to these factors, Shimadzu has received numerous requests for software that is capable of the automatic analysis of data resulting from an integration of EDX and FTIR data, all by a single software package. Additionally, features such as the ability to integrate the analysis results acquired by two instruments and compare those results with standard data, and the ability to comprehensively store a range of files, including image files and reports, using the software were also demanded.
This EDX-FTIR contaminant finder/material inspector was designed to meet the needs of such users. Shimadzu has newly developed algorithms that use its libraries, which are known for their superior hit rate, to the maximum benefit. These developments result in a software product that, for the first time in the industry, integrates and analyzes EDX data and FTIR data.


1. Integrated Analysis of EDX and FTIR Data and Fast, Highly Precise Display of Candidate Contaminants

Newly developed algorithms enable comprehensive analysis of specified EDX and FTIR data, which are checked against the contaminant library. Then, in a few seconds, a hit list ordered according to the probability of a match is displayed. The library contains practical information such as the material, color, shape, and metallic luster of contaminants that have actually been detected. It can be expanded by adding new entries. The software greatly enhances the efficiency of analyses and reduces the burden placed on the analyst by eliminating some of the time-consuming work normally required. It thus provides strong support for the identification of contaminants.

2. Supports Acceptance Inspection Through Comparisons of Analysis Results with Data in the Contaminant Library

Specified data acquired by EDX and FTIR are compared with a selected data item in the contaminant library, and the respective degrees of matching are displayed. This function can be effectively used for inspecting materials being received, when the compositions of the raw materials are already known, and as a countermeasure against "silent changes," whereby a supplier has made unauthorized changes to the compositions of raw materials.

3. Functionality for Registering and Storing Image and Text Files

The software provides for the storage of image files and document files in PDF format linked to analysis data, enabling the establishment of a more paperless environment for a great variety of information. By saving photographic data for analyzed samples and reports created after using other analytical instruments, quick access to the necessary data can be obtained.

Models Supported by This Software

EDX-7000/EDX-8000 energy dispersive X-ray fluorescence spectrometers
Fourier transform infrared spectrophotometers manufactured by Shimadzu that can be controlled using LabSolutions IR/IRsolution/AIMsolution workstations.

For more details, visit
EDXIR-Analysis EDX-FTIR Contaminant Finder/Material Inspector