High Resolution Scanning Probe Microscope
See the Nano World Come to Life
The new HR-SPM scanning probe microscope uses frequency detection.
This instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
HR-SPM: High Resolution Scanning Probe Microscope
Features of the HR-SPM
- Uses the FM-AFM method
- Noise in air and liquids is reduced to 1/20th that of existing methods.
- Achieves the performance level of a vacuum-type SPM, even in air and liquids!
Existing SPMs (scanning probe microscopes) and AFMs (atomic force microscopes) generally use AM (amplitude modulation). In principle however, the FM (frequency modulation) measurement method enables higher imaging resolution.
|SPM||：||Scanning Probe Microscope|
|AFM||：||Atomic Force Microscope|
Differences From Existing SPM/AFM
Atomic Resolution Observations in Solution
Observations were made of the arrangement of atoms on a NaCl surface in a saturated aqueous solution. Atoms hidden by noise in existing AFM observations (AM method, left) are clearly visible when the FM method (right) is used. The FM method provides true atomic resolution.
Pt Catalyst Particles Observation in Air1)
Pt catalyst particles in a TiO2substrate were identified, and the surface potential was measured using a KPFM. Pt particles several nm in size were observed in the exchange of charges with the substrate. In the figure on the right, the red circles indicate positive potential, and the blue circles indicate negative potential. It is evident that the resolution has been dramatically improved, even for a KPFM.
Note: KPFM functionality is available on a special order basis.
* Appearance and specifications are subject to change without notice.