Shimadzu Review Vol.79[1・2](2022)
Green Innovation

SPECIALLY COLLECTED PAPERS

Measuring Local Material Properties with the SPM-NanoaTM Scanning Probe Microscope
— Applications in Materials Development for Carbon Neutrality —

by Hideo Nakajima1Yuichiro Ikeda1Kenji Yamasaki1Keita Fujino1Kotomi Kuroda1Hiroshi Arai1Kazuma Watanabe1Masato Hirade, Ph.D.2Eiji Iida3Akinori Kogure4Shogo Onomura4Shiho Moriguchi, Ph.D.4

Shimadzu Review 79[1・2] (2022)

Abstract

The scanning probe microscope (SPM) or atomic force microscope (AFM) can observe the local surface topography of a sample and measure local properties at the nanometer scale. SPM/AFM do not require an electrically conductive sample, and are extremely versatile tools that can analyze a wide range of materials from polymers to biological samples in a variety of environments including vacuum, gases, and liquids. Because of these features, SPM/AFM are expected to find use in an increasing range of applications comparable to other high-resolution observational tools such as optical microscopes and electron microscopes. We have developed the SPM-Nanoa, a new SPM/AFM with improved basic performance and enhanced usability compared to previous models. The improved features of the SPM-Nanoa enable anyone to obtain high-resolution measurements of the shape and properties of a sample with ease. The SPM-Nanoa is expected to be especially useful in the development of new materials for carbon-neutral technology. This article presents example applications of the SPM-Nanoa, including using the SPM-Nanoa to evaluate the mechanical properties of composite materials and the electrical properties of the cathode material from a lithium-ion battery.


1X-ray /Surface Business Unit, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kyoto, Japan
2Material & Infrastructure Solution Unit, Solutions Center of Excellence, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kyoto, Japan
3Material & Infrastructure Solution Unit, Solutions Center of Excellence, Analytical & Measuring Instruments Division, Shimadzu Corporation, Kanagawa, Japan
4Shimadzu Techno-Research, Inc, Kyoto, Japan

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