Microanalysis Using the EMPA-8050G

In recent years, along with progress in nanotechnology, a variety of industrial goods have become miniaturized, reduced in quantities, and made more precise. Since all manufactured products consist of substances existing on earth, where resources are limited, materials development is being progressed with the objective of reducing their consumption, particularly with respect to limited resources such as rare metals. Under these situations, the creation of nanoparticles of the materials used has also progressed, which has required high-resolution and high-sensitivity analysis in microscopic regions. The CeB6-EPMA, which has become very popular recently, is capable of high-sensitivity and high-resolution image observations and element analysis (See Application News P94).
Here, we introduce a sample analysis with the FE-EPMA, which is capable of analyzing even more microscopic regions.