High-Speed Residual Stress Measurement by X-Ray Diffraction (Linear Guide)
– OneSight™ Wide-Range High-Speed Detector –

The OneSight wide-range high-speed detector consists of a semiconductor array with more than 1000 channels. Compared with the conventional scintillation detector, higher-speed measurement is achieved due to its sensitivity, which is more than twenty times that of the scintillation type. In residual stress measurement by X-ray diffraction, where one peak of interest is targeted, it is effective to utilize the "One-Shot mode" in which the detector is fixed using a wide acquisition angle that includes the target peak position.