WingSALD II - Features

WingSALD II Data Processing Software for SALD Series

Automatic Refractive Index Calculation Function Eliminates Selecting Refractive Indices

Selecting a refractive index was an unavoidable part of using the laser diffraction method, where generally a published value was entered, but such values were not necessarily appropriate, considering the effects of particle composition and shape. Therefore, tedious trial-and-error processes were used to select refractive indices. WingSALD II solves such problems by being the world's first software to include a function that automatically calculates an appropriate refractive index based on the LDR method (light intensity distribution reproduction method).

The LDR method automatically calculates an appropriate refractive index based on consistency between the actual measured light intensity distribution and one reproduced (recalculated) from particle size distribution data. This method was developed by Shimadzu and published in two technical papers. It is sometimes called the "Kinoshita Method", in academic communities, after the name of Shimadzu’s engineer.

Measurement Assistant Function Allows Preparing an SOP to Ensure Measurements Are Always Performed Using the Same Conditions and Procedures


Creating, saving, and sharing measurement conditions and procedures, including pretreatment methods and conditions, ensures measurements are performed using the same conditions and procedures, even if performed by a different operator or at a different location or plant, and allows safely comparing data. Furthermore, when the measurement assistant function is used, measurement instructions for the operator are displayed on the screen. This enables inexperienced operators to perform measurements correctly. In addition, administrators and operators can be assigned different operating privileges to ensure security.

Note: SOP is an acronym for Standard Operating Procedure.

Evaluates Measurement Data from Multiple Facets

  • Evaluation of Scattering Angle
  • Graphs the components of scattered light intensity at each angle. This takes advantage of the features of the highly-integrated photodiode array to allow evaluating the low-angle scattered light with high resolution.
    Application Fields: Evaluating the scattering characteristics of films and sheets
  • Data Emulation Function
  • Based on SALD series measurement results, this function allows emulating measurement results obtained using other models and measurement principles. This allows maintaining data compatibility with previous measurement methods.
  • Mixture Data Simulation Function
  • Allows simulating particle size distributions using any mixture ratio of multiple particle size distributions. This makes it possible to determine the optimal mixture ratio for obtaining the desired particle size distribution, without the trouble of actually measuring the particle size distribution of sample mixtures over and over.
  • Data Connecting Function
  • Allows combining the measurement results for two different measurement ranges at any particle size point to create a single particle size distribution. For example, sieve data for particles above 2000 μm can be combined with SALD series data for particles below 2000 μm fo create a wide-ranging particle size distribution, which is required for civil engineering, disaster prevention, and environmental fields.

Processes Multiple Sets of Data More Efficiently

Multiple sets of data can be stored as a group.
This makes organizing, re-displaying, and re-analyzing data easier.
Data can be loaded as a group and displayed or analyzed at the same time, rather than having to load each set of data separately.


Allows verifying the validity of measurement results (particle size distribution data) by referencing light intensity distribution data (raw data)

Since light intensity distribution data (raw data) and measurement results (particle size distribution data) can be displayed on the same screen, measurement results can be verified while viewing both sets of data. This allows not only verifying whether the detection signal level (particle concentration) is appropriate or not, but also confirming the validity of measurement results from multiple aspects, such as in terms of the distribution width and the presence of aggregates and contaminants.

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