Kratos AXIS Nova - Specs
Imaging X-Ray Photoelectron Spectrometer
|X-ray photoelectron spectroscopy (XPS)||
Spectroscopic performance is defined as counts per second for a FWHM measured for the Ag 3d5/2 component.
|XPS parallel imaging||
Ultimate spatial resolution of parallel imaging mode is < 3 um.
|Performance on insulators||
The AXIS Nova has an electron only charge neutralisation system. Performance of the charge neutraliser system is confirmed on the standard polymer, polyethylene terephthalate (PET).
Up to three large, 110 mm diameter sample platens can be introduced to the AXIS Nova at a time. Sample handling is fully automated.
Minibeam 4 monatomic Ar+ ion source or Minibeam 6 multi-mode Gas Cluster Ion Source (GCIS) for sample cleaning and sputter depth profiling.
Kratos Analytical has a policy of continuous product improvement and therefore reserves the right to make alterations to specifications without notice. Please contact us to request the latest AXIS Nova specification sheet.