Surface Analysis

Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers.
EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.

Product Information


Product Lineup

SPM-8100FM High Resolution Scanning Probe Microscope

This instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.

SPM-9700HT Scanning Probe Microscope

Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications.

EPMA-8050G Electron Probe Microanalyzer

This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order.

EPMA-1720 Electron Probe Microanalyzer

Both hardware and software incorporate the latest technologies to create the next generation of EPMA.

Product Lineup

X-Ray Photoelectron Spectrometers

Visit Kratos Analytical web site for information on our XPS instruments.

Solution System Packages

For Research Use Only. Not for use in diagnostic procedures.

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