SolidSpec-3700i/3700iDUV - Downloads

Next-Generation Mobility Technology Evaluation C10G-E098A Next-Generation Mobility Technology Evaluation www.shimadzu.com/an/ For Research Use Only. Not for use in diagnostic procedures. This publication may contain references to products that are n ...

User Benefits Application News Fig. 1 shows an example of the installation positions of the collision avoidance sensor and sensor cover. The laser light scanned from the LiDAR device is transmitted through a sensor cover and irradiated on remote mea ...

User Benefits Application News LiDAR, an abbreviation for Light Detection and Ranging, is one type of optical sensor technology. The distance and angle to a remote measurement target and its nature can be analyzed by scanning laser light on the targ ...

C101-E180 UV-Vis Spectrophotometers Accessories UV-Vis Series Accessories To make full use of the impressive functionality offered by UV–Vis–NIR spectrophotometers, optimal accessories must be selected based on the given application field or sampl ...

Variable Angle Absolute Reflectance System for SolidSpec-3700 – Absolute Reflectance Measurement of Silicon Wafer Surface at Any Incident Angle – Use of a variable angle absolute reflectance attachment allows measurement of the absolute reflectance a ...

Introduction of Variable Angle Absolute Reflectance Attachment for the SolidSpec-3700 The variable angle absolute reflectance attachment is an attachment that allows absolute reflectance measurement with an angle of incidence selectable within the r ...

A pp l ica t i on N e w s LAAN-A-UV-E019 N o . A419 ■ Attachment and Sample Used for the Measurement S p e c t ro p h o t o m e t r i c A n a l y s i s A variable angle absolute reflectance attachment was used for the measurement. Fig. 1 shows a sc ...

Application of SolidSpec-3700 with the Automatic X-Y Stage -Measurement of Transmittance Distribution Map of Sample Plane- Fig.2 Automatic X-Y Stage Fig.3 12-inch Wafer Set on Automatic X-Y Stage Fig.1 SolidSpec-3700DUV Using the automatic X-Y stage ...

Light Electrode n-silicon p-silicon Rear electrode Sample Anti-reflective film Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700 Solar cells, devices which convert light energy to electrical energy, ar ...

ApplicationNews No. A463 Spectrophotometric Analysis Reflectance Measurements of an Apple and Pear, and Prediction of Elapsed Days by Multivariate Analysis LAAN-A-UV-E036 Fruit gradually undergoes change with the passage of time after harvesting. Exa ...